样片
It is found that Ge not only can promote the out-diffusion of oxygen and form wider DFZ in Ge-Doped CZSi wafer than that in the control sample, but also can suppress the formation of precipitation.
发现直拉硅中杂质锗的存在可促进氧的外扩散,抑制氧沉淀的发生并可形成较宽的清洁区。
We really have not had a big enough sample to determine Wafer really is.
我们没有足够大的样本来确定wafer的未来.
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